Publications

Open access: https://rdcu.be/dnAbK
BibTeX:
@INPROCEEDINGS{10014827, author={Viera, Raphael and Lima, Rodrigo Silva and Dutertre, Jean-Max and Pommies, Matthieu and Bertrand, Anthony}, booktitle={Journal of Cryptographic Engineering}, title={Tampering with the flash memory of microcontrollers: permanent fault injection via laser illumination during read operations}, year={2023}, doi={10.1007/s13389-023-00335-z}}, note = {\url{https://rdcu.be/dnAbK} [Accessed: 03/10/2023]}

Open access: https://telecom-paris.hal.science/hal-04260842/file/TCAD_2023_Laser.pdf
BibTeX:
@ARTICLE{10273624, author={Ebrahimabadi, Mohammad and Mehjabin, Suhee Sanjana and Viera, Raphael and Guilley, Sylvain and Danger, Jean-Luc and Dutertre, Jean-Max and Karimi, Naghmeh}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, title={Delfines: Detecting Laser Fault Injection Attacks Via Digital Sensors}, year={2023}, volume={}, number={}, pages={1-1}, doi={10.1109/TCAD.2023.3322623}}

BibTeX:
@INPROCEEDINGS{10014827, author={Lima, Rodrigo Silva and Viera, Raphael and Dutertre, Jean-Max and Ribotta, Anne-Lise and Pommies, Matthieu and Bertrand, Anthony}, booktitle={2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)}, title={Target Preparation Methodology for Semi-Invasive Attacks on Microcontrollers}, year={2022}, pages={1-7}, doi={10.1109/PAINE56030.2022.10014827}}

BibTeX:
@INPROCEEDINGS{9840318, author={Ebrahimabadi, Mohammad and Mehjabin, Suhee Sanjana and Viera, Raphael and Guilley, Sylvain and Danger, Jean-Luc and Dutertre, Jean-Max and Karimi, Naghmeh}, booktitle={2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)}, title={Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors}, year={2022}, pages={97-100}, doi={10.1109/HOST54066.2022.9840318}}

BibTeX:
@inproceedings{10.1145/3560834.3563825, author = {Viera, Raphael and Dutertre, Jean-Max and Silva Lima, Rodrigo}, title = {Injecting Permanent Faults into the Flash Memory of a Microcontroller with Laser Illumination During Read Operations}, year = {2022}, isbn = {9781450398848}, publisher = {Association for Computing Machinery}, address = {New York, NY, USA}, url = {https://doi.org/10.1145/3560834.3563825}, doi = {10.1145/3560834.3563825}, booktitle = {Proceedings of the 2022 Workshop on Attacks and Solutions in Hardware Security}, pages = {75–84}, numpages = {10}, keywords = {backside attacks, laser fault injection, flash memory}, location = {Los Angeles, CA, USA}, series = {ASHES’22} }

BibTeX:
@INPROCEEDINGS{9897189, author={Da Cruz, William Souza and Viera, Raphael and Rigaud, Jean-Baptiste and Hubert, Guillaume and Dutertre, Jean-Max}, booktitle={2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)}, title={An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation}, year={2022}, pages={1-5}, doi={10.1109/IOLTS56730.2022.9897189}}

BibTeX:
@INPROCEEDINGS{9668233, author={da Cruz, William Souza and Viera, Raphael and Dutertre, Jean-Max and Rigaud, Jean-Baptiste and Hubert, Guillaume}, booktitle={2021 IEEE 30th Asian Test Symposium (ATS)}, title={Further Analysis of Laser-induced IR-drop}, year={2021}, pages={91-96}, doi={10.1109/ATS52891.2021.00028}}

BibTeX:
@INPROCEEDINGS{9462773, author={Viera, Raphael and Dutertre, Jean-Max and Dumont, Mathieu and Moëllic, Pierre-Alain}, booktitle={2021 19th IEEE International New Circuits and Systems Conference (NEWCAS)}, title={Permanent Laser Fault Injection into the Flash Memory of a Microcontroller}, year={2021}, pages={1-4}, doi={10.1109/NEWCAS50681.2021.9462773}}

BibTeX:
@INPROCEEDINGS{9595075, author={Dumont, Mathieu and Moëllic, Pierre-Alain and Viera, Raphael and Dutertre, Jean-Max and Bernhard, Rémi}, booktitle={2021 IEEE 7th World Forum on Internet of Things (WF-IoT)}, title={An Overview of Laser Injection against Embedded Neural Network Models}, year={2021}, pages={616-621}, doi={10.1109/WF-IoT51360.2021.9595075}}

@ARTICLE{9007471, author={Possamai Bastos, R. and Dutertre, J.-M. and Garay Trindade, M. and Viera, R. A. C. and Potin, O. and Letiche, M. and Cheymol, B. and Beaucour, J.}, journal={IEEE Transactions on Nuclear Science}, title={Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron-Induced Transients}, year={2020}, volume={67}, number={7}, pages={1404-1411}, doi={10.1109/TNS.2020.2975923}}

@ARTICLE{8764388, author={Viera, Raphael A. Camponogara and Maurine, Philippe and Dutertre, Jean-Max and Possamai Bastos, Rodrigo}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems}, title={Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection}, year={2020}, volume={39}, number={6}, pages={1231-1244}, doi={10.1109/TCAD.2019.2928972}}

@ARTICLE{8730377, author={Trindade, Matheus Garay and Coelho, Alexandre and Valadares, Carlos and Viera, Raphael A. C. and Rey, Solenne and Cheymol, Benjamin and Baylac, Maud and Velazco, Raoul and Bastos, Rodrigo Possamai}, journal={IEEE Transactions on Nuclear Science}, title={Assessment of a Hardware-Implemented Machine Learning Technique Under Neutron Irradiation}, year={2019}, volume={66}, number={7}, pages={1441-1448}, doi={10.1109/TNS.2019.2920747}}

@phdthesis{camponogaraviera:tel-02150306, TITLE = {{Simulating and modeling the effects of laser fault injection on integrated circuits}}, AUTHOR = {Viera, Raphael}, URL = {https://theses.hal.science/tel-02150306}, NUMBER = {2018MONTS072}, SCHOOL = {{Universit{\’e} Montpellier}}, YEAR = {2018}, MONTH = Oct, KEYWORDS = {Transient-Fault Detection ; Laser-Induced Fault Sources ; Integrated Circuits ; Methodologies for EDA ; Hardware security implementation ; Design for test \& security ; D{\’e}tection de fautes transitoires ; Attaques par faisceau Laser ; Circuits int{\’e}gr{\’e}s ; M{\’e}thodologies pour EDA ; Impl{\’e}mentation de s{\’e}curit{\’e} mat{\’e}rielle ; Conception pour test \& s{\’e}curit{\’e}}, TYPE = {Theses}, PDF = {https://theses.hal.science/tel-02150306/file/VIERA_2018_archivage.pdf}, HAL_ID = {tel-02150306}, HAL_VERSION = {v1}, } }

@inproceedings{10.1145/3177540.3178243, author = {Viera, Raphael A.C. and Dutertre, Jean-Max and Maurine, Philippe and Bastos, Rodrigo Possamai}, title = {Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits}, year = {2018}, isbn = {9781450356268}, publisher = {Association for Computing Machinery}, address = {New York, NY, USA}, url = {https://doi.org/10.1145/3177540.3178243}, doi = {10.1145/3177540.3178243}, booktitle = {Proceedings of the 2018 International Symposium on Physical Design}, pages = {160–167}, numpages = {8}, keywords = {hardware security, laser-induced IR drop, laser fault injection, laser fault attack}, location = {Monterey, California, USA}, series = {ISPD ’18} }

@article{VIERA2018128, title = {Assessing body built-in current sensors for detection of multiple transient faults}, journal = {Microelectronics Reliability}, volume = {88-90}, pages = {128-134}, year = {2018}, note = {29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ( ESREF 2018 )}, issn = {0026-2714}, doi = {https://doi.org/10.1016/j.microrel.2018.07.111}, url = {https://www.sciencedirect.com/science/article/pii/S0026271418306826}, author = {R.A.C. Viera and J.-M. Dutertre and M.-L. Flottes and O. Potin and G. Di Natale and B. Rouzeyre and R. Possamai Bastos}, abstract = {Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.} }

@article{CAMPONOGARAVIERA201768, title = {Method for evaluation of transient-fault detection techniques}, journal = {Microelectronics Reliability}, volume = {76-77}, pages = {68-74}, year = {2017}, issn = {0026-2714}, doi = {https://doi.org/10.1016/j.microrel.2017.07.007}, url = {https://www.sciencedirect.com/science/article/pii/S0026271417302913}, author = {R.A. {Camponogara Viera} and R. Possamai Bastos and J.-M. Dutertre and P. Maurine and R. Iga Jadue}, keywords = {Transient fault, Concurrent error detection, Fault detection, Transient-fault detection}, abstract = {This work introduces a simulation-based method for evaluating the efficiency of detection techniques in identifying transient faults provoked in combinational logic blocks. Typical fault profiles are simulated in campaigns of injections that reproduce output scenarios of fault-affected combinational circuits. Furthermore, a detection technique is proposed and compared to state-of-the-art strategies by using the method presented herein. Results show the capabilities of all studied techniques, providing a rank in terms of their efficiencies in detecting transient faults induced in combinational logic circuits, and analyzing the situations in which soft errors are produced in memory elements.} }

@INPROCEEDINGS{8049793, author={Viera, Raphael Andreoni Camponogara and Dutertre, Jean-Max and Bastos, Rodrigo Possamai and Maurine, Philippe}, booktitle={2017 Euromicro Conference on Digital System Design (DSD)}, title={Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation}, year={2017}, pages={252-259}, doi={10.1109/DSD.2017.43}}

@INPROCEEDINGS{7981593, author={Viera, Raphael A. Camponogara and Maurine, Philippe and Dutertre, Jean-Max and Bastos, Rodrigo Possamai}, booktitle={2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)}, title={Importance of IR drops on the modeling of laser-induced transient faults}, year={2017}, pages={1-4}, doi={10.1109/SMACD.2017.7981593}}

@article{viera2015validation, title={Validation of single bbics architecture in detecting multiple faults}, author={Viera, R and Bastos, R Possamai and Dutertre, J and Potin, O and Flottes, ML and Di Natale, G and Rouzeyre, B}, journal={ATS, Nov}, year={2015} }

@inproceedings{10.1145/2660540.2660977, author = {Viera, Raphael A. C. and Prior, Cesar Augusto and de La Cruz, Jorge and Martins, Jo\~{a}o Baptista}, title = {System-Level Design of a Reconfigurable CT SD Modulator for Multi-Standard Wireless Applications}, year = {2014}, isbn = {9781450331562}, publisher = {Association for Computing Machinery}, address = {New York, NY, USA}, url = {https://doi.org/10.1145/2660540.2660977}, doi = {10.1145/2660540.2660977}, booktitle = {Proceedings of the 27th Symposium on Integrated Circuits and Systems Design}, articleno = {9}, numpages = {6}, keywords = {system-level design, A/D conversion, high order noise-shaping, CT sigma-delta modulator}, location = {Aracaju, Brazil}, series = {SBCCI ’14} }

@inproceedings{viera2011aguirre, title={de Aguirre, Leonardo Londero de Oliveira and Joao Baptista Martins,” Iterative Mode Hardware Implementation of CORDIC Algorithm,”}, author={Viera, Raphael A Camponogara and Paulo Cesar, C}, booktitle={Proceeding of the 26th South Symposium on Microelectronics (SIM 2011)}, year={2011} } }